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Semiconductor Bonding AOl

Rapid & Easy Use 3D Inspection

Designed for power component packaging post die and wire bonding defect detection.

Combined 2D camera & 3D structured light image capture for rapid inspection.

Compatible with conveyor track to allow for inline testing and features offline testing with automatic loading and unloading.

Al-powered smart programming vastly improves programming efficiency.

Completely offline programming capabilities - debugging without stopping production.

Flexible lighting and adjustable Z-axis easily handle complicated inspection situations.

Links with MES systems, supports TCP/IP, SECS/GEM communication protocols and more.

Advanced SPC capabilities support data review and process analysis.

Semiconductor Bonding AOl
Technology & Advantages Technical Specification

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