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Semiconductor Mounting AOl

Chip & Substrate Scratch Inspection Expert

Marble platform and high-resolution telecentric lens are applied to ensure high precision.

6 channel multi-angle programmable lighting, can be flexibly matched to amplify defect features. 

Intelligent recognition of gold fingers and substrate areas to enable inspection of any position on the substrate.

Powerful algorithms allow for strong gold finger scratch and yellowing inspection capabilities.

Multi-layer positioning algorithm can cope with board bending deformation, with vacuum adsorption option available.

Can be collocated with loader and unloader for offline inspection.

Support docking with SECS/GEM system for data upload and mapping calibration, etc.

Semiconductor Mounting AOl
Technology & Advantages Technical Specification

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